NF EN ISO 19749

NF EN ISO 19749

March 2023
Standard Current

Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy

This document specifies methods of determining nanoparticle size and shape distributions by acquiring and evaluating scanning electron microscope images and by obtaining and reporting accurate results.NOTE 1    This document applies to particles with a lower size limit that depends on the required uncertainty and on the suitable performance of the SEM, which is to be proven first -according to the requirements described in this document.NOTE 2    This document applies also to SEM-based size and shape measurements of larger than nanoscale particles.

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Main informations

Collections

National standards and national normative documents

Publication date

March 2023

Number of pages

80 p.

Reference

NF EN ISO 19749

ICS Codes

07.120   Nanotechnologies

Classification index

T16-403

Print number

1

International kinship

ISO 19749:2021

European kinship

EN ISO 19749:2023
Sumary
Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy

This document specifies methods of determining nanoparticle size and shape distributions by acquiring and evaluating scanning electron microscope images and by obtaining and reporting accurate results.

NOTE 1    This document applies to particles with a lower size limit that depends on the required uncertainty and on the suitable performance of the SEM, which is to be proven first -according to the requirements described in this document.

NOTE 2    This document applies also to SEM-based size and shape measurements of larger than nanoscale particles.

Replaced standards (1)
NF ISO 19749
September 2021
Standard Cancelled
Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy

This document specifies methods of determining nanoparticle size and shape distributions by acquiring and evaluating scanning electron microscope images and by obtaining and reporting accurate results. NOTE 1    This document applies to particles with a lower size limit that depends on the required uncertainty and on the suitable performance of the SEM, which is to be proven first -according to the requirements described in this document. NOTE 2    This document applies also to SEM-based size and shape measurements of larger than nanoscale particles.

Table of contents
  • 1 Domaine d'application
  • 2 Références normatives
  • 3 Termes et définitions
  • 4 Principes généraux
  • 5 Préparation des échantillons
  • 6 Qualification du MEB pour les mesurages des nanoparticules
  • 7 Acquisition d'images
  • 8 Analyse de particules
  • 9 Analyse des données
  • 10 Rapport de résultats
  • Annexe A (normative) Qualification du MEB pour les mesurages des nanoparticules
  • Annexe B (informative) Préparation d'échantillons transversaux de dioxyde de titane
  • Annexe C (informative) Étude de cas portant sur des nanoparticules bien dispersées de dioxyde de silicium de 60 nm
  • Annexe D (informative) Étude de cas portant sur des nanoparticules de dioxyde de titane de 40 nm
  • Annexe E (informative) Exemple d'extraction de résultats de taille des particules issus de mesurages de nanoparticules par MEB à l'aide d'ImageJ
  • Annexe F (informative) Effets de certains paramètres d'acquisition d'images et des méthodes de seuillage sur les mesurages de taille de particules par MEB
  • Annexe G (informative) Exemple de rapport de résultats de mesurages de nanoparticules par MEB
  • Bibliographie
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