NF ISO 19749

NF ISO 19749

September 2021
Standard Cancelled

Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy

This document specifies methods of determining nanoparticle size and shape distributions by acquiring and evaluating scanning electron microscope images and by obtaining and reporting accurate results.NOTE 1    This document applies to particles with a lower size limit that depends on the required uncertainty and on the suitable performance of the SEM, which is to be proven first -according to the requirements described in this document.NOTE 2    This document applies also to SEM-based size and shape measurements of larger than nanoscale particles.

Main informations

Collections

National standards and national normative documents

Publication date

September 2021

Number of pages

77 p.

Reference

NF ISO 19749

ICS Codes

07.120   Nanotechnologies

Classification index

T16-403

Print number

1

International kinship

Sumary
Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy

This document specifies methods of determining nanoparticle size and shape distributions by acquiring and evaluating scanning electron microscope images and by obtaining and reporting accurate results.

NOTE 1    This document applies to particles with a lower size limit that depends on the required uncertainty and on the suitable performance of the SEM, which is to be proven first -according to the requirements described in this document.

NOTE 2    This document applies also to SEM-based size and shape measurements of larger than nanoscale particles.

Standard replaced by (1)
NF EN ISO 19749
March 2023
Standard Current
Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy

This document specifies methods of determining nanoparticle size and shape distributions by acquiring and evaluating scanning electron microscope images and by obtaining and reporting accurate results. NOTE 1    This document applies to particles with a lower size limit that depends on the required uncertainty and on the suitable performance of the SEM, which is to be proven first -according to the requirements described in this document. NOTE 2    This document applies also to SEM-based size and shape measurements of larger than nanoscale particles.

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