NF ISO 14997
Optic and optical instruments - Test methods for surface imperfections of optical elements
ISO 14997:2003 establishes the physical principles and practical means for the implementation of two methods, specified in ISO 10110-7, for measuring surface imperfections. These methods are: Method l, the surface area obscured or affected by the defects, and, Method ll, the visibility of the imperfections. Both methods are suitable for prototype, small scale or large scale production of a wide variety of optical components. Imperfection appearance or functional tolerances related to a particular component can be determined by agreement between supplier and customer.
ISO 14997:2003 establishes the physical principles and practical means for the implementation of two methods, specified in ISO 10110-7, for measuring surface imperfections. These methods are: Method l, the surface area obscured or affected by the defects, and, Method ll, the visibility of the imperfections.
Both methods are suitable for prototype, small scale or large scale production of a wide variety of optical components. Imperfection appearance or functional tolerances related to a particular component can be determined by agreement between supplier and customer.
<p>ISO 14997:2011 establishes the physical principles and practical means for the implementation of methods for measuring surface imperfections. This method evaluates the surface area obscured or affected by the imperfections.</p>
- Avant-proposiv
- Introductionv
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1 Domaine d'application1
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2 Références normatives1
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3 Termes et définitions1
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4 Principes physiques2
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5 Méthode I: Mesurage de la zone obscurcie ou affectée par les défauts3
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5.1 Généralités 3
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5.2 Exigences 3
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5.3 Étalonnage 4
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5.4 Mode opératoire5
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5.5 Rapport d'essai5
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6 Méthode II: Mesurage de la visibilité des imperfections6
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6.1 Généralités 6
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6.2 Étalonnage 6
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6.3 Mode opératoire 6
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6.4 Rapport d'essai7
- Annexe A (informative) Contrôle des éléments selon la Méthode I8
- Annexe B (informative) Dimensions recommandées des étalons sur un plateau de comparaison gradué pour la Méthode I9
- Annexe C (informative) Description de l'instrument de mesure des imperfections inférieures à 0,01 mm: Microscope comparateur d'images (Méthode I)10
- Annexe D (informative) Contrôle qualité des imperfections 13
- Annexe E (informative) Poste de contrôle (Méthode II)15
- Bibliographie20
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