XP ISO/TS 10867
Nanotechnologies - Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy
ISO/TS 10867:2010 provides guidelines for the characterization of single-wall carbon nanotubes (SWCNTs) using near infrared (NIR) photoluminescence (PL) spectroscopy.ISO/TS 10867:2010 provides a measurement method for the determination of the chiral indices of the semi-conducting SWCNT in a sample and their relative integrated PL intensities.The method can be expanded to estimate relative mass concentrations of semi-conducting SWCNTs in a sample from measured integrated PL intensities and knowledge of their PL cross-sections.
ISO/TS 10867:2010 provides guidelines for the characterization of single-wall carbon nanotubes (SWCNTs) using near infrared (NIR) photoluminescence (PL) spectroscopy.
ISO/TS 10867:2010 provides a measurement method for the determination of the chiral indices of the semi-conducting SWCNT in a sample and their relative integrated PL intensities.
The method can be expanded to estimate relative mass concentrations of semi-conducting SWCNTs in a sample from measured integrated PL intensities and knowledge of their PL cross-sections.
This document gives guidelines for the characterization of single-wall carbon nanotubes (SWCNTs) using near infrared (NIR) photoluminescence (PL) spectroscopy. It provides a measurement method for the determination of the chiral indices of the semi-conducting SWCNTs in a sample and their relative integrated PL intensities. The method can be expanded to estimate the relative mass concentrations of semi-conducting SWCNTs in a sample from their measured integrated PL intensities and knowledge of their PL cross-sections.
- Avant-proposiv
- Introductionv
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1 Domaine d'application1
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2 Références normatives1
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3 Termes et définitions1
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4 Principes de la photoluminescence dans les nanotubes de carbone mono feuillet (SWCNT)2
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4.1 Structure des SWCNT2
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4.2 Structure de bande et pics de photoluminescence (PL)3
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4.3 Effets des excitons5
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5 Appareillage pour la spectroscopie de photoluminescence dans le proche infrarouge (NIR-PL)5
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5.1 Spectromètre NIR-PL5
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5.2 Source lumineuse5
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6 Méthodes de préparation des échantillons6
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6.1 Préparation pour la mesure d'une dispersion de SWCNT dans D206
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6.2 Préparation pour la mesure d'un film solide à partir d'une dispersion de SWCNT6
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7 Modes opératoires de mesure7
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8 Analyse des données et interprétation des résultats7
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8.1 Règles empiriques pour la détermination de la structure7
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8.2 Détermination des indices chiraux des SWCNT semi-conducteurs présents dans un échantillon8
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9 Incertitudes9
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10 Rapport d'essai9
- Annexe A (informative) Études de cas10
- Bibliographie17
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