XP ISO/TS 10867
XP ISO/TS 10867

XP ISO/TS 10867

July 2020
Standard Current

Nanotechnologies - Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy

This document gives guidelines for the characterization of single-wall carbon nanotubes (SWCNTs) using near infrared (NIR) photoluminescence (PL) spectroscopy.It provides a measurement method for the determination of the chiral indices of the semi-conducting SWCNTs in a sample and their relative integrated PL intensities.The method can be expanded to estimate the relative mass concentrations of semi-conducting SWCNTs in a sample from their measured integrated PL intensities and knowledge of their PL cross-sections.

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Main informations

Collections

National standards and national normative documents

Publication date

July 2020

Number of pages

27 p.

Reference

XP ISO/TS 10867

ICS Codes

07.120   Nanotechnologies

Classification index

T16-200

Print number

1

International kinship

ISO/TS 10867:2019
Sumary
Nanotechnologies - Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy

This document gives guidelines for the characterization of single-wall carbon nanotubes (SWCNTs) using near infrared (NIR) photoluminescence (PL) spectroscopy.

It provides a measurement method for the determination of the chiral indices of the semi-conducting SWCNTs in a sample and their relative integrated PL intensities.

The method can be expanded to estimate the relative mass concentrations of semi-conducting SWCNTs in a sample from their measured integrated PL intensities and knowledge of their PL cross-sections.

Replaced standards (1)
XP ISO/TS 10867
XP ISO/TS 10867
February 2011
Standard Cancelled
Nanotechnologies - Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy

ISO/TS 10867:2010 provides guidelines for the characterization of single-wall carbon nanotubes (SWCNTs) using near infrared (NIR) photoluminescence (PL) spectroscopy. ISO/TS 10867:2010 provides a measurement method for the determination of the chiral indices of the semi-conducting SWCNT in a sample and their relative integrated PL intensities. The method can be expanded to estimate relative mass concentrations of semi-conducting SWCNTs in a sample from measured integrated PL intensities and knowledge of their PL cross-sections.

Table of contents
  • Avant-propos
  • 1 Domaine d'application
  • 2 Références normatives
  • 3 Termes et définitions
  • 4 Principes de la photoluminescence dans les SWCNT
  • 5 Appareillage NIR-PL
  • 6 Méthodes de préparation des échantillons
  • 7 Modes opératoires de mesure
  • 8 Analyse des données et interprétation des résultats
  • 9 Incertitudes
  • 10 Rapport d'essai
  • Annexe A (informative) Études de cas
  • Bibliographie
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