IEC 60747-10:1991
IEC 60747-10:1991

IEC 60747-10:1991

May 1991
International standard Cancelled

Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits

It is a generic specification for semiconductor devices, discretedevices and integrated circuits, including multichip integratedcircuits, but excluding hybrid circuits.It defines general procedures for quality assessment to be used inthe IECQ System and gives general rules for measuring methods ofelectrical characteristics, climatic and mechanical tests, andendurance tests.

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Main informations

Collections

International IEC standards

Publication date

May 1991

Number of pages

86 p.

Reference

IEC 60747-10:1991

ICS Codes

31.200   Integrated circuits. Microelectronics
31.080.01   Semiconductor devices in general

Print number

1 - juin 2005
Sumary
Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits

It is a generic specification for semiconductor devices, discrete devices and integrated circuits, including multichip integrated circuits, but excluding hybrid circuits. It defines general procedures for quality assessment to be used in the IECQ System and gives general rules for measuring methods of electrical characteristics, climatic and mechanical tests, and endurance tests.
Replaced standards (1)
IEC 60747-10:1984
IEC 60747-10:1984
January 1984
International standard Cancelled
Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits

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